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SAM Analysis (Scanning Acoustic Microscopy)


This technique is valuable in picking up the signs of delamination within parts, such as popcorning in ICs or voids in underfills.

The technique is becoming useful as a tool to detect counterfeit parts that have been subjected to undesirable processing at the end of an earlier life.

Call us today to discuss your individual problems.
Contact:
Zoe Sullivan on +44-1727-871 307 or zoe.sullivan@itri.co.uk  
Switchboard +44-1727-875 544

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